In-situ XPS analysis of oxidized and reduced plasma deposited ruthenium-based thin catalytic films

摘要

A novel in-situ study of the surface molecular structure of catalytically active ruthenium-based films subjected to the oxidation (in oxygen) and reduction (in hydrogen) was performed in a Cat-Cell reactor combined with a XPS spectrometer. The films were produced by the plasma deposition method (PEMOCVD). It was found that the films contained ruthenium at different oxidation states: metallic (Ru-0), RuO2 (Ru+4), and other RuOx (Ru+X), of which content could be changed by the oxidation or reduction, depending on the process temperature. These results allow to predict the behavior of the Ru-based catalysts in different redox environments. (C) 2017 Elsevier B.V. All rights reserved.