首页> 外国专利> Method of offset calibration in a successive approximation register analog-to-digital converter and a successive approximation register analog-to-digital converter

Method of offset calibration in a successive approximation register analog-to-digital converter and a successive approximation register analog-to-digital converter

机译:逐次逼近寄存器模数转换器和逐次逼近寄存器模数转换器中的失调校准方法

摘要

A method of offset calibration in a SAR ADC is disclosed. In one aspect, the method comprises determining a number of bits of an analog input signal (VIN), detecting if a binary code determined from the analog input signal (VIN) matches at least one trigger code, using at least one setting code to determine a calibration bit (B*LSB; B*MSB), analyzing a bit of the digital signal (COUT) and the calibration bit (B*LSB; B*MSB), determining an indication of a presence of offset error, and calibrating the offset error. As the determination of the calibration bit (B*LSB; B*MSB) requires only one additional comparison, when compared to the normal operation, the normal operation does not need to be interrupted. Therefore, the calibration can be done in the background and thus can be performed frequently thereby taking into account time-varying changes due to environmental effects.
机译:公开了一种SAR ADC中的失调校准的方法。一方面,该方法包括确定模拟输入信号(V IN )的位数,检测是否从模拟输入信号(V IN )确定了二进制代码。 )匹配至少一个触发代码,使用至少一个设置代码来确定校准位(B * LSB ; B * MSB ),分析数字信号的一位(C OUT )和校准位(B * LSB ; B * MSB ),确定存在偏移误差的指示,以及校准偏移误差。由于确定校准位(B * LSB ; B * MSB )仅需要进行一次额外的比较,因此与正常操作相比,正常操作不需要被打断。因此,可以在后台进行校准,因此可以经常执行校准,从而考虑到由于环境影响而引起的时变变化。

著录项

  • 公开/公告号US10230386B2

    专利类型

  • 公开/公告日2019-03-12

    原文格式PDF

  • 申请/专利权人 STICHTING IMEC NEDERLAND;

    申请/专利号US201715835373

  • 发明设计人 MING DING;HANYUE LI;PIETER HARPE;

    申请日2017-12-07

  • 分类号H03M1/10;H03M1/44;H03M1/46;

  • 国家 US

  • 入库时间 2022-08-21 12:14:19

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