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A Digital Background Calibration Technique for Successive Approximation Register Analog-to-Digital Converter

机译:逐次逼近寄存器模数转换器的数字背景校准技术

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A digital background calibration technique that corrects the capacitor mismatches error is proposed for successive approximation register analog-to-digital converter (SAR ADC). The technique is implemented in SAR ADC which is based on tri-level switching. The termination capacitor in the Digital-to-Analog Converter (DAC) is regarded as a reference capacitor and the digital weights of all other unit capacitors are corrected with respect to the reference capacitor. To make a comparison between the size of the unit capacitor and that of the reference capacitor, each input sample is quantized twice. The unit capacitor being calibrated is swapped with the reference capacitor during the second conversion. The difference between the two conversion results is used to correct the digital weight of the unit capacitor under calibration. The calibration technique with two reference capacitors is presented to reduce the number of parameters to be estimated. Behavior simulation is performed to verify the proposed calibration technique by using a 12-bit SAR ADC with 3% random capacitor mismatch. The simulation results show that the Signal-to-Noise and Distortion Ratio (SNDR) is improved from 57.2 dB to 72.2 dB and the Spurious Free Dynamic Range (SFDR) is improved from 60.0 dB to 85.4 dB.
机译:针对逐次逼近寄存器模数转换器(SAR ADC),提出了一种校正电容器失配误差的数字背景校准技术。该技术在基于三级开关的SAR ADC中实现。数模转换器(DAC)中的端接电容器被视为参考电容器,并且所有其他单位电容器的数字权重均相对于参考电容器进行了校正。为了在单位电容器和参考电容器的尺寸之间进行比较,每个输入采样被量化两次。在第二次转换期间,将要校准的单位电容器与参考电容器交换。两次转换结果之差用于校正校准后的单位电容器的数字权重。提出了使用两个参考电容器的校准技术,以减少要估计的参数数量。通过使用具有3%随机电容器失配的12位SAR ADC进行行为仿真,以验证建议的校准技术。仿真结果表明,信噪比和失真比(SNDR)从57.2 dB提高到72.2 dB,无杂散动态范围(SFDR)从60.0 dB提高到85.4 dB。

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