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MEMORY ARRAY AND MEASURING AND TESTING METHODS FOR INTER-HAMMING DIFFERENCES OF MEMORY ARRAY
MEMORY ARRAY AND MEASURING AND TESTING METHODS FOR INTER-HAMMING DIFFERENCES OF MEMORY ARRAY
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机译:内存阵列以及内存阵列锤间差异的测量和测试方法
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摘要
A memory device is provided. The memory device includes a memory array including a plurality of sections, and an inter-hamming difference analyzer. Each of the sections has an individual location in the memory array. The inter-hamming difference analyzer is configured to obtain a plurality of inter-hamming differences according to the number of unlike bits between content of each section of the plurality of sections corresponding to a first operating condition and content of another section of the plurality of sections corresponding to a second operating condition.
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