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CMOS IMAGE SENSOR INCLUDING STACKED SEMICONDUCTOR CHIPS AND IMAGE PROCESSING CIRCUITRY INCLUDING A SUPERLATTICE

机译:包括堆叠的半导体芯片的CMOS图像传感器和包括超晶格的图像处理电路

摘要

A CMOS image sensor may include a first semiconductor chip including image sensor pixels and readout circuitry electrically connected thereto, and a second semiconductor chip coupled to the first chip in a stack and including image processing circuitry electrically connected to the readout circuitry. The processing circuitry may include a plurality of transistors each including spaced apart source and drain regions and a superlattice channel extending between the source and drain regions. The superlattice channel may include a plurality of stacked groups of layers, each group of layers may include a plurality of stacked base semiconductor monolayers defining a base semiconductor portion, and a non-semiconductor monolayer(s) constrained within a crystal lattice of adjacent base semiconductor portions. Each transistor may further include a gate insulating layer on the superlattice channel and a gate electrode on the gate insulating layer.
机译:CMOS图像传感器可以包括:第一半导体芯片,其包括图像传感器像素和与其电连接的读出电路;以及第二半导体芯片,其以堆叠方式耦合至第一芯片并且包括电连接至读出电路的图像处理电路。处理电路可以包括多个晶体管,每个晶体管包括间隔开的源极和漏极区域以及在源极和漏极区域之间延伸的超晶格沟道。超晶格沟道可以包括多个堆叠的层组,每组层可以包括限定基底半导体部分的多个堆叠的基底半导体单层,以及约束在相邻基底半导体的晶格内的非半导体单层。部分。每个晶体管还可包括在超晶格沟道上的栅极绝缘层和在栅极绝缘层上的栅电极。

著录项

  • 公开/公告号US2019189669A1

    专利类型

  • 公开/公告日2019-06-20

    原文格式PDF

  • 申请/专利权人 ATOMERA INCORPORATED;

    申请/专利号US201715842990

  • 发明设计人 YI-ANN CHEN;ABID HUSAIN;HIDEKI TAKEUCHI;

    申请日2017-12-15

  • 分类号H01L27/146;H01L29/15;H01L29/10;H01L29/16;

  • 国家 US

  • 入库时间 2022-08-21 12:09:33

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