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Defect screening method for electronic circuits and circuit components using power spectrum anaylysis
Defect screening method for electronic circuits and circuit components using power spectrum anaylysis
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机译:利用功率谱分析的电子电路及电路部件缺陷筛选方法
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摘要
A method involving the non-destructive testing of a sample electrical or electronic device is provided. The method includes measuring a power spectrum of the device and performing a Principal Component Analysis on the power spectrum, thereby to obtain a set of principal components of the power spectrum. The method further includes selecting a subset consisting of some of the principal components, and comparing the subset to stored reference data that include representations in terms of principal components of one or more reference populations of devices. Based at least partly on the comparison, the sample device is classified relative to the reference populations.
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