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SEMICONDUCTOR-PRODUCT TESTING DEVICE, METHOD FOR TESTING SEMICONDUCTOR PRODUCT, AND SEMICONDUCTOR PRODUCT
SEMICONDUCTOR-PRODUCT TESTING DEVICE, METHOD FOR TESTING SEMICONDUCTOR PRODUCT, AND SEMICONDUCTOR PRODUCT
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机译:半导体产品的测试装置,半导体产品的测试方法以及半导体产品
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摘要
A semiconductor-product testing device that supplies a test pattern for testing a semiconductor product to the semiconductor product includes a pattern memory that stores a part of the test pattern. The pattern memory is rewritten during a time when the semiconductor product is tested by a part of the test pattern stored in the pattern memory included in the semiconductor-product testing device.
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