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BUMP STRUCTURE, SEMICONDUCTOR PACKAGE INCLUDING THE BUMP STRUCTURE, AND METHOD OF FORMING THE BUMP STRUCTURE

机译:凹凸结构,包括凹凸结构的半导体封装以及凹凸结构的形成方法

摘要

A bump structure includes an under bump metal (UBM) layer, a pillar bump and a capping layer. The UBM layer is disposed on a pad of a semiconductor chip. The pillar bump is disposed on the UBM layer. The capping layer is disposed on the UBM layer and surrounds an outer surface of the pillar bump. The capping layer has a height of about 0.5 times to 0.7 times a height of the pillar bump as measured from the UBM layer where an upper portion of the pillar bump is exposed. The capping layer suppresses stresses applied to a metal wiring in the semiconductor chip while attaching the semiconductor chip to a package substrate and maintain an adhesion force between the pillar bump and the package substrate.
机译:凸块结构包括凸块下金属(UBM)层,柱形凸块和覆盖层。 UBM层设置在半导体芯片的焊盘上。柱状凸块设置在UBM层上。覆盖层设置在UBM层上并且围绕柱状凸块的外表面。从覆盖柱状凸块的上部的UBM层测量,覆盖层的高度约为柱状凸块的高度的0.5倍至0.7倍。覆盖层在将半导体芯片附接到封装基板的同时抑制了施加到半导体芯片中的金属布线的应力,并且维持了柱状凸块与封装基板之间的粘合力。

著录项

  • 公开/公告号US2019096836A1

    专利类型

  • 公开/公告日2019-03-28

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号US201815937586

  • 发明设计人 BO-IN NOH;

    申请日2018-03-27

  • 分类号H01L23;

  • 国家 US

  • 入库时间 2022-08-21 12:05:03

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