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METHOD FOR MANUFACTURING LOW-TEMPERATURE POLYSILICON DEVICE AND METHOD FOR FLATTENING POLYSILICON LAYER

机译:低温多晶硅器件的制造方法和使多晶硅层平坦化的方法

摘要

A method for flattening a polysilicon layer (4) of a low-temperature polysilicon device, comprising: step S1, crystallizing a low-temperature polysilicon device; step S2, forming a flat coating layer (5) on an uneven surface of the polysilicon layer (4) of the crystallized low-temperature polysilicon device by means of a coating process; step S3, curing the flat coating layer (5); and step S4, removing the cured flat coating layer (5) and polysilicon protrusions (41) by means of a removal process to form the polysilicon layer (4) having a flat surface. According to the method, the rough and uneven surface of the polysilicon layer (4) can be flattened well, so that the problems of film breakage, incomplete etching, and point discharge caused by roughness of the polysilicon layer (4) are mitigated, thereby improving the production yield of the low-temperature polysilicon device.
机译:一种平坦化低温多晶硅器件的多晶硅层(4)的方法,该方法包括:步骤S1,使低温多晶硅器件结晶。步骤S2,在结晶态低温多晶硅器件的多晶硅层(4)的凹凸表面上通过涂覆工艺形成平坦的涂层(5)。步骤S3,固化平坦涂层(5);步骤S4,通过去除工艺去除固化的平坦涂层(5)和多晶硅凸起(41),形成具有平坦表面的多晶硅层(4)。根据该方法,可以很好地平坦化多晶硅层(4)的粗糙表面和不平坦表面,从而减轻了由多晶硅层(4)的粗糙度引起的膜破裂,蚀刻不完全和点放电的问题,从而提高了低温多晶硅器件的产量。

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