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WIRE BONDING BETWEEN ISOLATION CAPACITORS FOR MULTICHIP MODULES

机译:多芯片模块的隔离电容器之间的导线键合

摘要

A packaged multichip device includes a first IC die (110) with an isolation capacitor using a top metal layer as its top plate (118) and a lower metal layer as its bottom plate (119). A second IC die (120) has a second isolation capacitor using its top metal layer as its top plate (128) and a lower metal layer as its bottom plate (129). A first bondwire end (130a) is coupled to one top plate and a second bondwire end (130b) is coupled to the other top plate. The second bondwire end (130b) includes a stitch bond (134) including a wire approach angle not normal to the top plate it is bonded to and is placed so that the stitch bond's center is positioned at least 5% further from an edge of this top plate on a bondwire crossover side compared to a distance of the stitch bond's center from the side opposite the bondwire crossover side.
机译:封装的多芯片器件包括具有隔离电容器的第一IC管芯(110),该隔离电容器使用顶部金属层作为其顶板(118)和下部金属层作为其底板(119)。第二IC管芯(120)具有第二隔离电容器,该第二隔离电容器使用其顶部金属层作为其顶板(128)并且使用下部金属层作为其底板(129)。第一键合线端(130a)耦合至一个顶板,而第二键合线端(130b)耦合至另一顶板。第二键合线端(130b)包括缝线键合(134),该缝线键合(134)包括不垂直于其键合的顶板的导线接近角,并被放置成使得缝线键合的中心距离该键合线的边缘至少5%。与针脚键合中心到与键合线交叉面相反的一侧的距离相比,键合线交叉面上的顶板。

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