首页> 外国专利> TRANSISTORS INCLUDING FIRST AND SECOND SEMICONDUCTOR MATERIALS BETWEEN SOURCE AND DRAIN REGIONS AND METHODS OF MANUFACTURING THE SAME

TRANSISTORS INCLUDING FIRST AND SECOND SEMICONDUCTOR MATERIALS BETWEEN SOURCE AND DRAIN REGIONS AND METHODS OF MANUFACTURING THE SAME

机译:源极和漏极区域之间包括第一和第二半导体材料的晶体管及其制造方法

摘要

Methods, apparatus, systems and articles of manufacture are disclosed for transistors including first and second semiconductor materials between source and drain regions. An example apparatus includes a transistor comprising a first semiconductor material including gallium and nitrogen and a second semiconductor material including gallium and oxygen, where the second semiconductor material is adjacent the first semiconductor material. The disclosed example apparatus further includes a source proximate the first semiconductor material and spaced apart from the second semiconductor material and a drain proximate the second semiconductor material and spaced apart from the first semiconductor material. The disclosed example apparatus also includes a gate located between the source and the drain.
机译:公开了用于晶体管的方法,装置,系统和制品,所述晶体管包括在源极和漏极区域之间的第一和第二半导体材料。示例设备包括包括晶体管的晶体管,该晶体管包括含镓和氮的第一半导体材料和含镓和氧的第二半导体材料,其中第二半导体材料与第一半导体材料相邻。所公开的示例设备还包括靠近第一半导体材料并且与第二半导体材料间隔开的源极以及靠近第二半导体材料并且与第一半导体材料间隔开的漏极。公开的示例装置还包括位于源极和漏极之间的栅极。

著录项

  • 公开/公告号WO2019139621A1

    专利类型

  • 公开/公告日2019-07-18

    原文格式PDF

  • 申请/专利权人 INTEL CORPORATION;

    申请/专利号WO2018US13602

  • 申请日2018-01-12

  • 分类号H01L29/417;H01L21/8234;H01L29/66;

  • 国家 WO

  • 入库时间 2022-08-21 11:53:56

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号