首页> 外国专利> TUNGSTEN SILICIDE TARGET MEMBER AND METHOD FOR MANUFACTURING SAME, AND METHOD FOR MANUFACTURING TUNGSTEN SILICIDE FILM

TUNGSTEN SILICIDE TARGET MEMBER AND METHOD FOR MANUFACTURING SAME, AND METHOD FOR MANUFACTURING TUNGSTEN SILICIDE FILM

机译:钨硅靶材及其制造方法以及钨硅膜的制造方法

摘要

Provided is a tungsten silicide target member for efficiently suppressing generation of particles during sputtering film formation. A tungsten silicide target member having a two-phase structure of a WSi2 phase and a Si phase, wherein the compositional formula thereof in terms of atomic ratio is WSix (where X 2.0), the ratio (I1/S1) of the total area I1 of Si grains in which the area per Si particle is 63.6 µm2 or greater with respect to the total area S1 of Si grains constituting the Si phase when a sputtering surface is observed is 5% or less, and the Weibull modulus of the flexural strength is 2.1 or greater.
机译:本发明提供一种用于有效地抑制溅射成膜时的粒子产生的硅化钨靶材。具有WSi 2 相和Si相的两相结构的硅化钨靶部件,其中,其原子比的组成式为WSi x (其中X> 2.0),其中每个Si颗粒的面积为63.6 µm 2 的Si晶粒的总面积I1与Si晶粒的总面积S1之比(I1 / S1)观察到溅射面时的Si相的组成为5%以下,弯曲强度的威布尔模量为2.1以上。

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