首页> 外国专利> Trapezoidal type PION pin with improved contact yield and test socket having the same

Trapezoidal type PION pin with improved contact yield and test socket having the same

机译:具有改善的接触良率的梯形PION引脚和具有该引脚的测试插座

摘要

According to the present invention, provided is a PION pin comprising: a pad connection pin configured to be in contact with a contact pad; a ball connection pin configured to be in contact with a conductive ball; an elastic spring installed between the pad connection pin and the ball connection pin; and a multiple-contact spot auxiliary pin configured to be combined with the ball connection pin and to be in contact with the conductive ball and to form multiple contact spots. According to the configuration of the present invention, contact yield increase can be expected through a contact in a surface to surface multiple contact spots with a spherical conductive ball.
机译:根据本发明,提供了一种PION引脚,其包括:焊盘连接引脚,被配置为与接触焊盘接触;以及球连接销,其配置为与导电球接触;弹性弹簧安装在垫连接销和球连接销之间。多触点点辅助引脚,其构造成与球连接引脚结合并与导电球接触并形成多个触点。根据本发明的构造,可以期望通过与球形导电球在表面至表面上的多个接触点之间的接触来提高接触良率。

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