Provided are a defect inspection device and a defect inspection method for inspecting a defect of a circularly polarized plate or an elliptically polarized plate or a phase difference plate used for generating circularly polarized light or elliptically polarized light and realizing high versatility, a method for manufacturing a circularly polarized plate or an elliptically polarized plate, and a method for manufacturing a phase difference plate using the defect inspection method. A defect inspection device (10) according to one embodiment is a defect inspection device for inspecting defects of a circularly polarized plate (12) or an elliptically polarized plate having a linearly polarized plate (20) and a phase difference plate (22) and includes a light irradiation unit (14) disposed on the linearly polarized plate side of the circularly polarized plate or the elliptically polarized plate and emitting inspection light to an imaging region (A) of the circularly polarized plate or the elliptically polarized plate, a reflecting member (16) reflecting the light output from the circularly polarized plate or the elliptically polarized plate irradiated with the inspection light toward the circularly polarized plate or the elliptically polarized plate and disposed on the side opposite to the light irradiation unit when viewed from the circularly polarized plate or the elliptically polarized plate, and an imaging unit (18) disposed on the same side as the light irradiation unit when viewed from the circularly polarized plate or the elliptically polarized plate.;COPYRIGHT KIPO 2019
展开▼
