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A Novel High Volume Manufacturing Method for Defect-free and High-yield SiN Micro-sieve Membranes

         

摘要

Micro-sieves have been widely used in medical treatment,quarantine,environment,agriculture,pharmacy and food processing.However,the manufacturing and yield improvement have been difficult due to multiple challenges,such as the sieve unit release defect,cracking,and KOH corrosion.In this paper,we report process details and discuss technical difficulties which are usually the root-causes for process failures,and demonstrate a reliable and high yield production of SiNx micro-sieves processed with our novel method,which is also compatible with high volume manufacturing.

著录项

  • 来源
    《微电子制造学报》 |2018年第1期|P.11-20|共10页
  • 作者单位

    [1]Key Laboratory of Microelectronic Devices&Integrated Technology;

    Institute of Microelectronics of Chinese Academy of Sciences;

    Beijing 100029;

    China;

    [1]Key Laboratory of Microelectronic Devices&Integrated Technology;

    Institute of Microelectronics of Chinese Academy of Sciences;

    Beijing 100029;

    China;

    [2]University of Chinese Academy of Sciences;

    Beijing 100049;

    China;

    [1]Key Laboratory of Microelectronic Devices&Integrated Technology;

    Institute of Microelectronics of Chinese Academy of Sciences;

    Beijing 100029;

    China;

    [1]Key Laboratory of Microelectronic Devices&Integrated Technology;

    Institute of Microelectronics of Chinese Academy of Sciences;

    Beijing 100029;

    China;

    [1]Key Laboratory of Microelectronic Devices&Integrated Technology;

    Institute of Microelectronics of Chinese Academy of Sciences;

    Beijing 100029;

    China;

    [2]University of Chinese Academy of Sciences;

    Beijing 100049;

    China;

  • 原文格式 PDF
  • 正文语种 CHI
  • 中图分类 无线电电子学、电信技术;
  • 关键词

    micro-sieves; high volume manufacturing; defect free; high yield;

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