首页> 外国专利> Improved hydrogen passivation to mitigate hydrogen induced recombination (HIR) and surface passivation degradation in PV devices

Improved hydrogen passivation to mitigate hydrogen induced recombination (HIR) and surface passivation degradation in PV devices

机译:改进的氢钝化可减轻PV器件中的氢诱导重组(HIR)和表面钝化降解

摘要

The present invention provides a method for manufacturing a photovoltaic device. In particular, the present invention relates to the use of hydrogen during the manufacture of photovoltaic devices for passivating defects in silicon and dealing with photo-induced degradation. The method of the present invention utilizes the generation and handling of hydrogen in a neutral or charged state to optimize defect passivation. Some methods include heat treatment, illumination with sub-bandgap photons, defects in the silicon to control the electric field or the state of charge or hydrogen, transfer of hydrogen to a different location in the device, or the use of hydrogen remaining at a particular location do.
机译:本发明提供了一种用于制造光伏器件的方法。特别地,本发明涉及氢在光生伏打器件的制造过程中用于钝化硅中的缺陷并处理光致降解的用途。本发明的方法利用中性或带电状态的氢的产生和处理来优化缺陷钝化。一些方法包括热处理,用亚带隙光子照射,控制电场或电荷或氢状态的硅中的缺陷,将氢转移到设备中的其他位置或使用残留在特定位置的氢位置做。

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