首页> 外国专利> - - SIZE-COMPONENT MEASURING DEVICE OF ULTRA-FINE TENANT AND SIZE-COMPONENT MEASURING METHOD

- - SIZE-COMPONENT MEASURING DEVICE OF ULTRA-FINE TENANT AND SIZE-COMPONENT MEASURING METHOD

机译:--超细承租人的尺寸分量测量装置和尺寸分量测量方法

摘要

Disclosed are a size-component measurement device for an ultrafine particle, which provides excellent detection efficiency by having one light scattering module mounted between a trap unit and an ionization section unit for the ultrafine particle to correctly emit ionization laser on a time point when the ultrafine particle reaches, and a size-component measurement method. According to the present invention, the size-component measurement device for an ultrafine particle comprises: the trap unit receiving and trapping the ultrafine particle; a light scattering module coupled to a side surface of the trap unit and including a continuous wave laser emission unit which continuously emits a laser to the ultrafine particle moving from the trap unit, a scattering light detector which detects a scattering light signal generated when the ultrafine particle passes through the continuous wave laser beam by the continuous wave laser emission unit, and a reflective plate which reflects the scattering light to be collected to the scattering light detector; and the ionization section unit coupled to a side surface of the light scattering module and including an ionization laser emission unit which emits an ionization laser to the ultrafine particle, moving from the light scattering module and arriving after a required moving time of the ultrafine particle from a detection time of the scattering light signal, in order to ionize the ultrafine particle, and an ion mass analysis device which analyzes characteristics of the generated ion.
机译:公开了一种用于超细颗粒的尺寸成分测量装置,该装置通过在超细颗粒的捕获单元和电离部单元之间安装一个光散射模块以在超细颗粒的时间点正确地发射电离激光,从而提供了优异的检测效率。粒子到达,以及尺寸分量测量方法。根据本发明,用于超细颗粒的尺寸成分测量装置包括:捕获单元,其接收和捕获超细颗粒;以及捕集单元。光散射模块,其连接到捕集单元的侧面并包括连续波激光发射单元,该连续波激光发射单元连续向从捕集单元移动的超细粒子发射激光;散射光检测器,检测在超细单元中产生的散射光信号颗粒通过连续波激光发射单元穿过连续波激光束,并反射板,该反射板将要收集的散射光反射到散射光检测器。电离部单元,其与光散射模块的侧面连接,并且包括电离激光发射单元,该电离激光发射单元将电离激光发射到超细颗粒,该电离激光发射单元从光散射模块移动并在经过所需的超细颗粒移动时间之后到达。为了使超细粒子电离,需要检测光信号的检测时间和分析所生成的离子的特性的离子质量分析装置。

著录项

  • 公开/公告号KR20190101564A

    专利类型

  • 公开/公告日2019-09-02

    原文格式PDF

  • 申请/专利权人 GWANGJU INSTITUTE OF SCIENCE AND TECHNOLOGY;

    申请/专利号KR20180021681

  • 发明设计人 KI HONG PARK;HEE JOO CHO;

    申请日2018-02-23

  • 分类号G01N15/02;G01N27/62;G02B19;G02B5/08;

  • 国家 KR

  • 入库时间 2022-08-21 11:49:58

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