首页> 外国专利> - - SIZE-COMPONENT MEASURING DEVICE OF ULTRA-FINE TENANT AND SIZE-COMPONENT MEASURING METHOD

- - SIZE-COMPONENT MEASURING DEVICE OF ULTRA-FINE TENANT AND SIZE-COMPONENT MEASURING METHOD

机译:--超细承租人的尺寸分量测量装置和尺寸分量测量方法

摘要

A single light scattering module is mounted between the trapping portion of the ultrafine particles and the ionization region to accurately irradiate the ionizing laser at the time when the ultrafine particles arrive, thereby measuring the size-component and the size-component measuring method of the ultrafine particles with excellent detection efficiency Disclosed. The apparatus for measuring size-components of ultra-fine particles according to the present invention includes: a collection part in which ultra-fine particles are introduced and collected; It is coupled to the side of the collecting portion, the continuous-emitting laser irradiation unit continuously irradiating the laser to the ultra-fine particles moving from the collection unit, and the ultra-fine particles generated by the continuous-generating laser beam passing through the continuous-generating laser beam A light scattering module including a scattering light detector that detects a scattered light signal and a reflector that reflects the scattered light and is focused on the scattered light detector; And an ionization laser irradiation unit coupled to a side surface of the light scattering module and irradiating an ionizing laser to the ultrafine particles that have been moved from the light scattering module and reached after the required time for the movement of the ultrafine particles from the detection time of the scattered light signal. It characterized in that it comprises a; ionization region portion including an ion mass spectrometer for analyzing the properties of the generated ions.
机译:在超微粒子的捕获部分和电离区域之间安装单个光散射模块,以在超微粒子到达时准确地照射电离激光,从而测量超微粒子的尺寸成分和尺寸成分测量方法检测效率优异的微粒公开。根据本发明的用于测量超细颗粒的尺寸成分的设备包括:收集部,在该收集部中引入和收集超细颗粒。它耦合到收集部分的侧面,连续发射激光照射单元将激光连续照射到从收集单元移动的超细颗粒上,并且由连续产生的激光束产生的超细颗粒穿过连续产生激光束的光散射模块,其包括检测散射光信号的散射光检测器和反射所述散射光并聚焦在所述散射光检测器上的反射器。并且,电离激光照射单元耦接至光散射模块的侧表面,并且将电离激光照射至已从光散射模块移动并且在从检测到移动超细颗粒所需的时间之后到达的超细颗粒上。散射光信号的时间。其特征在于它包括一个;电离区域部分包括用于分析所产生离子的特性的离子质谱仪。

著录项

  • 公开/公告号KR102100774B1

    专利类型

  • 公开/公告日2020-04-14

    原文格式PDF

  • 申请/专利权人 광주과학기술원;

    申请/专利号KR20190127767

  • 发明设计人 박기홍;조희주;

    申请日2019-10-15

  • 分类号G01N15/02;G01N27/62;G02B19;G02B5/08;

  • 国家 KR

  • 入库时间 2022-08-21 11:04:51

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