首页> 外国专利> In NiGe -- MOSFET CONTAINING INDIUM-DOPED NiGe ELECTRODES AND METHOD OF FABRICATING THEREOF

In NiGe -- MOSFET CONTAINING INDIUM-DOPED NiGe ELECTRODES AND METHOD OF FABRICATING THEREOF

机译:在含铟掺杂NiGe电极的NiGe中-MOSFET及其制造方法

摘要

According to an embodiment of the present invention, a metal-oxide-semiconductor field effect transistor (MOSFET) comprises: a Ge substrate; a gate oxide layer formed on the Ge substrate; a gate formed on the gate oxide layer; and a source electrode and a drain electrode formed on the Ge substrate and spaced apart from each other. The source electrode and the drain electrode include: a Ge layer doped with indium; and a NiGe layer formed on the Ge layer doped with indium.
机译:根据本发明的一个实施例,金属氧化物半导体场效应晶体管(MOSFET)包括:Ge衬底;在Ge衬底上形成的栅氧化层;在栅极氧化层上形成的栅极;源电极和漏电极形成在Ge基板上并且彼此间隔开。源极和漏极包括:掺杂有铟的Ge层;以及在掺杂有铟的Ge层上形成的NiGe层。

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