EMBEDDED SYSTEM FOR EXAMINATION BASED ON ARTIFICIAL INTELLIGENCE THEREOF

摘要

An embedded system is disclosed. The system comprises: a communication unit for communicating with a management server, a photographing apparatus, and a lighting system; and a processor for controlling the communication unit to transmit at least one control signal of a 2D imaging control signal and a 3D scanning imaging control signal to the lighting system by using the lighting system. Furthermore, the processor obtains at least one of a 2D image and a 3D scanning image obtained by the photographing apparatus based on light output from the lighting system to a test target object according to the transmitted control signal through the communication unit, obtains a deep learning test recognition model from the management server, and identifies an abnormality of the test target object based on the obtained deep learning test recognition model and the obtained image.