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APPARATUS FOR MEASURING BROADBAND COMPLEX PERMITTIVITY USING OPEN-ENDED COAXIAL PROBE AND METHOD THEREOF

机译:用开放式同轴探针测量宽带复合物介电常数的装置及其方法

摘要

Disclosed are an apparatus for measuring a wideband complex dielectric constant using an open terminal coaxial probe, and a method thereof. The apparatus for measuring a wideband complex dielectric constant comprises: a probe for sensing electromagnetic waves reflected from each of a material under test, an open calibration material, and a matching calibration material; an analyzer connected with the probe by the coaxial cable, and receiving electromagnetic waves sensed from the probe to measure a first reflection coefficient of the material under test, a second reflection coefficient of the open calibration material, and a third reflection coefficient of the matching calibration material based on the received electromagnetic waves; and a terminal estimating a fourth reflection coefficient of a short-circuit calibration material based on the measured second reflection coefficient, and calculating the complex dielectric constant of the material under test based on the estimated fourth reflection constant, the measured first reflection coefficient, the measured second reflection coefficient, and the measured third reflection coefficient.
机译:公开了一种使用开放式终端同轴探针来测量宽带复介电常数的设备及其方法。用于测量宽带复介电常数的设备包括:探头,用于感测从每种被测材料,开放式校准材料和匹配的校准材料中反射的电磁波;分析仪,通过同轴电缆与探头连接,并接收从探头感应到的电磁波,以测量被测材料的第一反射系数,开放式校准材料的第二反射系数和匹配校准的第三反射系数基于接收到的电磁波的材料;端子,其基于所测量的第二反射系数来估计短路校准材料的第四反射系数,并且基于所估计的第四反射常数,所测量的第一反射系数,所测量的来计算被测材料的复介电常数。第二反射系数和测得的第三反射系数。

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