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Simultaneous extraction of the permittivity and permeability of conductor-backed lossy materials using open-ended waveguide probes.

机译:使用开放式波导探针同时提取背衬导体的有损耗材料的介电常数和磁导率。

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摘要

In this dissertation two non-destructive measurement techniques using flanged open-ended rectangular waveguide probes are developed and successfully demonstrate significant contributions in the field of material characterization. Each of these techniques provide accurate simultaneous extraction of permittivity and permeability from a conductor-backed lossy material having both magnetic and dielectric properties. The first technique is based on a single waveguide probe which employs a two-thickness method extraction. A rigorous solution to the reflection coefficient is compared with measured data from measurements of two different thicknesses of a sample material. Results show good agreement with those of traditional waveguide material characterization methods. The second technique is based on a collinear set of coupled waveguide probes. This novel dual probe configuration employs a rigorous formulation of the reflection and transmission coefficients providing exceptional accuracy. Comparison of results match the performance of well established, but destructive methods, providing a major contribution to this field. Uncertainty analysis indicates that the method is relatively insensitive to small changes in thickness and provides good results using typical material thickness tolerances.; Two secondary contributions also warrant attention. Unlike previous waveguide probe formulations which employ numerical integration over both the eta and xi spectral integrals, the approach used here provides a closed form solution to the eta-integral through complex analysis. This technique not only decreases computational time, but the complex analysis also provides physical insight into the probes. One important outcome is that the complex analysis revealed the fundamental mode of propagation through the material under test. Consequently, this led to the development and demonstration of a simple model allowing determination of the required flange dimensions to ensure sufficient decay of fringing fields, which is an important underlying assumption in the probe analysis.
机译:在本文中,开发了两种使用带凸缘的开口矩形波导探头的无损测量技术,并成功地证明了在材料表征领域的重要贡献。这些技术中的每一种都可以从同时具有磁性和介电特性的有导体衬里的有损耗材料中准确同时提取介电常数和磁导率。第一种技术基于采用两层方法提取的单波导探针。将反射系数的严格解决方案与来自两种不同厚度的样本材料的测量结果进行比较。结果表明与传统波导材料表征方法具有很好的一致性。第二种技术基于一组共线的耦合波导探针。这种新颖的双探头配置采用严格的反射系数和透射系数公式,可提供出色的精度。结果比较与公认的但具有破坏性的方法的性能相匹配,为该领域做出了重大贡献。不确定性分析表明,该方法对厚度的微小变化相对不敏感,并且使用典型的材料厚度公差可以提供良好的结果。还应注意两个次级方面的贡献。与以前的波导探针公式不同,它在eta和xi光谱积分上均采用数值积分,此处使用的方法通过复杂分析为eta积分提供了封闭形式的解决方案。该技术不仅减少了计算时间,而且复杂的分析还提供了对探针的物理了解。一个重要的结果是,复杂的分析揭示了通过被测材料传播的基本模式。因此,这导致了一个简单模型的开发和演示,该模型允许确定所需的法兰尺寸以确保边缘场充分衰减,这是探针分析中的重要基础假设。

著录项

  • 作者

    Stewart, James W.;

  • 作者单位

    Air Force Institute of Technology.;

  • 授予单位 Air Force Institute of Technology.;
  • 学科 Engineering Materials Science.
  • 学位 Ph.D.
  • 年度 2006
  • 页码 109 p.
  • 总页数 109
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 工程材料学;
  • 关键词

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