DEVICE FOR OBTAINING ELECTRON MICROSCOPIC IMAGE AND LOCAL ELEMENT ANALYSIS OF RADIOACTIVE SAMPLE BY ELECTRON MICROSCOPY IN RADIATION PROTECTION CHAMBER

摘要

FIELD: optics.;SUBSTANCE: invention relates to scanning electron microscopes (SEM) and is intended for obtaining an electron microscope image and local elemental analysis of a radioactive sample in a radiation protection chamber with data visualization on a computer screen. Essence of the invention lies in the fact that the device for obtaining an electron microscopic image and a local elemental analysis of a radioactive sample by electron microscopy in a radiation protection chamber contains an electronic unit, vacuum sensor, a wave dispersion spectrometer, a control unit and a turbomolecular pump equipped with lead radiation shielding screens against a radioactive sample under investigation placed on the working table of a microscope, in addition, the pen drive of the aperture unit is equipped with two electric drives for moving the apertures in two mutually perpendicular directions in the same plane, and the reverse-reflected-electron detector drive handle is electrically operated and with a toothed belt drive.;EFFECT: enhanced functionality through the use of an EMS in a radiation protection chamber.;1 cl, 5 dwg