CORRELATIVE MICROSCOPY OF LIGHT MICROSCOPE AND ELECTRON MICROSCOPE USING A WORK STATION COMPRISING SAMPLE HOLDER FOR CRYOGENIC ELECTRON MICROSCOPY FOR CORRELATIVE IMAGING DETECTION APPARATUS IN COMBINATION OF OPTICAL MICROSCOPY AND ELECTRON MICROSCOPY OR CORRELATIVE IMAGING DETECTION INCLUDING SAID WORK STATION

摘要

The present invention relates to a correlative imaging observation method for an optical microscope, and an electronic microscope using a correlative imaging detection device. More specifically, using a correlative ultra low temperature specimen preparing device for an electronic microscope of a new structure where a pre-treatment process for cooling a specimen grid by placing a grid into a coolant and a process of moving the pre-treated specimen grid to an optical microscope and placing and observing the specimen grid on the optical microscope is able to be performed within a single specimen preparing device; the ultra low temperature electronic microscope observation method for an optical microscope and an electronic microscope using a correlative imaging detection device enables rough positioning of a target through observation by the optical microscope before an ultra low temperature electronic microscope observation and enhances the preciseness of measurement by the electronic microscope by maintaining a frozen state of the specimen grid while the specimen grid is being moved after the optical microscope observation. As such, the present invention is able to be used in observing, tracking, and detecting nanoparticles such as viruses, micro vesicles, and cell organelles in a living body.