首页> 外国专利> WORK STATION INCLUDING SAMPLE HOLDER FOR CRYOGENIC ELECTRON MICROSCOPE FOR CORRELATIVE IMAGING DETECTION OF LIGHT MICROSCOPE AND ELECTRON MICROSCOPE, CORRELATIVE IMAGING DETECTION APPARATUS INCLUDING SAME, AND IMAGING DETECTION METHOD AND IMAGING SYSTEM USING SAME

WORK STATION INCLUDING SAMPLE HOLDER FOR CRYOGENIC ELECTRON MICROSCOPE FOR CORRELATIVE IMAGING DETECTION OF LIGHT MICROSCOPE AND ELECTRON MICROSCOPE, CORRELATIVE IMAGING DETECTION APPARATUS INCLUDING SAME, AND IMAGING DETECTION METHOD AND IMAGING SYSTEM USING SAME

机译:包括低温电子显微镜样品架的工作台,用于光显微镜和电子显微镜的相关成像检测,包括相同的相关成像检测装置,以及使用相同方法的成像检测方法和成像系统

摘要

The present invention relates to: a work station for correlative measurement of a light microscope and an electron microscope, more specifically, a work station that includes a sample holder for a cryogenic electron microscope for correlative imaging detection of a light microscope and an electron microscope; a correlative imaging detection apparatus including the same; and an imaging detection method and an imaging system using the same, wherein the work station comprises: a grid accommodating part (150) that is formed on the upper surface of the work station (10) for locating a sample grid in a light microscope and has a coolant accommodating portion (310), a grid accommodating recess (340), and a through-hole (156) that are formed therein, wherein liquid nitrogen for cooling the sample grid is supplied into the coolant accommodating portion (310), the grid accommodating recess (340) is used to locate the sample grid in a space that is separated from the coolant accommodating portion (310) by an accommodating-portion partition wall (323), and the through-hole (156) is formed on a side of the grid accommodating recess (340) to communicate with the outside; and a sample holder (14) that is attached/detached to locate a mounting head (380) in the grid accommodating part (150) through the through-hole (156), wherein the mounting head (380) on which the sample gird is seated is formed at a tip end of an extension tube (180) through which liquid nitrogen is supplied from a cooler (170) outside the grid accommodating part (150).
机译:技术领域本发明涉及一种用于光学显微镜和电子显微镜的相关测量的工作站,更具体地,一种包括用于低温电子显微镜的样品保持器的工作站,该低温电子显微镜用于光学显微镜和电子显微镜的相关成像检测。相关成像检测设备包括该设备;成像检测方法和使用该成像检测方法的成像系统,其中,工作站包括:网格容纳部分(150),其形成在工作站(10)的上表面上,用于在光学显微镜中定位样品网格;以及在其中形成有冷却剂容纳部(310),格栅容纳凹部(340)和通孔(156),其中用于冷却样品格栅的液氮被供应到冷却剂容纳部(310)中,格栅容纳凹部(340)用于将样品格栅放置在通过容纳部分隔壁(323)与冷却剂容纳部(310)隔开的空间中,在基板上形成通孔(156)。格栅容纳凹部(340)的一侧与外部连通。样品保持器(14),其通过通孔(156)安装/拆卸以将安装头(380)通过通孔(156)定位在栅格容纳部分(150)中,其中,安装有样品架的安装头(380)在延伸管(180)的尖端处形成有固定座,在延伸管(180)的末端从冷却器(170)在格栅容纳部(150)外部供应液氮。

著录项

  • 公开/公告号WO2016021745A1

    专利类型

  • 公开/公告日2016-02-11

    原文格式PDF

  • 申请/专利权人 KOREA BASIC SCIENCE INSTITUTE;

    申请/专利号WO2014KR07230

  • 发明设计人 JUNG HYUN SUK;JUN SANGMI;

    申请日2014-08-05

  • 分类号G01N1/28;G01N1/42;G02B21/28;G02B21/34;H01J37/26;G01N23/04;

  • 国家 WO

  • 入库时间 2022-08-21 14:19:02

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