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PROCESS ABNORMAL STATE DIAGNOSING DEVICE AND ABNORMAL STATE DIAGNOSING METHOD

机译:过程异常状态诊断装置及异常状态诊断方法

摘要

An anomalous state diagnostic device 1A diagnoses an anomalous state of a process based on a plurality of deviation indexes for the magnitude of deviation from a reference that is the normal state of the process, and includes: a color mapping unit 64 configured to configure a two-dimensional matrix that has a first axis as an axis of a temporal factor including time and that has a second axis as an axis of an item of each deviation index, associate each cell of the matrix with data for an item of the deviation index and a temporal factor, and allocate a color in accordance with the magnitude of the deviation index to each cell of the matrix; and a color map display unit 65 configured to display a color map produced by the color mapping unit.
机译:异常状态诊断设备1A基于多个偏离指数来诊断过程的异常状态,所述偏离指数是与作为过程正常状态的基准相比的偏离的大小,并且包括:颜色映射单元64,其配置为配置两个具有第一轴作为包括时间的时间因子的轴并且具有第二轴作为每个偏差指标的项的轴的三维矩阵,将矩阵的每个单元与偏差指标项的数据相关联,并时间因子,并根据偏差指数的大小为矩阵的每个单元分配颜色;颜色图显示单元65,被配置为显示由颜色映射单元产生的颜色图。

著录项

  • 公开/公告号EP3644152A1

    专利类型

  • 公开/公告日2020-04-29

    原文格式PDF

  • 申请/专利权人 JFE STEEL CORPORATION;

    申请/专利号EP20180820645

  • 发明设计人 HIRATA TAKEHIDE;

    申请日2018-06-19

  • 分类号G05B23/02;G06Q10;B21B38;

  • 国家 EP

  • 入库时间 2022-08-21 11:38:36

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