首页> 外国专利> AHEAD SICK DETECTOR AND PATHOLOGY TENDENCY ANALYSIS SYSTEM (AHEAD SICK CHECKER)

AHEAD SICK DETECTOR AND PATHOLOGY TENDENCY ANALYSIS SYSTEM (AHEAD SICK CHECKER)

机译:病态检测器和病理趋势分析系统(病态检查器)

摘要

To develop a dedicated autonomic nerve measurement device and construct a series of system for detecting a pathology tendency of an individual on the basis of an ahead sick stage as an ahead sick checker, since statistic data indicating association between measurement data at ryodoraku measurement point on the basis of a ryodoraku theory and symptom is not formally accumulated and collected.SOLUTION: A measurement point on the basis of the ryodoraku theory is measured by a dedicated autonomic nerve measurement device which is newly developed, then the acquired data is communicated to application software mounted on a smartphone to collect and accumulate measurement data in a host computer, thereby constructing big data. The ahead sick checker comprises a system in which a large amount of information accumulated in the host computer is subjected to pathology tendency analysis by an artificial intelligence, and an organization (medical workers having national qualifications) managing the system.SELECTED DRAWING: Figure 3
机译:为了开发专用的自主神经测量装置,并构建一系列系统,用于根据作为疾病提前检查者的疾病提前阶段来检测个人的病理趋势,这是因为统计数据指示出在该区域的ryodoraku测量点处的测量数据之间的关联。解决方案:通过新开发的专用自主神经测量装置对基于ryodoraku理论的测量点进行测量,然后将获取的数据传送至安装的应用软件在智能手机上收集和存储主机中的测量数据,从而构建大数据。预先疾病检查器包括一个系统,在该系统中,主机上积累的大量信息将通过人工智能进行病理趋势分析,以及一个组织(具有国家资格的医务人员)对该系统进行管理。图3

著录项

  • 公开/公告号JP2019195601A

    专利类型

  • 公开/公告日2019-11-14

    原文格式PDF

  • 申请/专利权人 SHIMIZU HIDEKI;SHIRAI YURI;

    申请/专利号JP20180101015

  • 发明设计人 SHIMIZU HIDEKI;SHIRAI YURI;

    申请日2018-05-10

  • 分类号A61B5/05;A61B5;

  • 国家 JP

  • 入库时间 2022-08-21 11:35:39

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