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Quantification method and quantification device for accuracy of coating film edge

机译:涂膜边缘精度的量化方法及量化装置

摘要

To provide a quantification method of accuracy of a coating film end part that makes it possible to multilaterally and objectively evaluate accuracy of an end part in a width direction of a coating film formed in a longitudinal direction on a base material.SOLUTION: A quantification method of accuracy of a coating film end part includes the steps of: obtaining an electronic image of a coating film 3 on a base material 2; extracting an image of an evaluation area 4 including a coating film end part 31 from the electronic image; obtaining an optical profile of a coating film 3, and an optical profile of an exposed surface of the base material 2 by analysis means 6; setting a reference straight line in almost parallel with a coating film end 32 inside the evaluation area 4, and obtaining an index of a size of unevenness by the analysis means 6 on the basis of a distance in the width direction between the reference straight line and the coating film end 32; and obtaining an index of smoothness of fine unevenness on the basis of an entire extention of the coating film end 32.SELECTED DRAWING: Figure 1
机译:本发明提供一种涂膜端部的精度的定量方法,该方法能够从多方向,客观地评价在基材上沿长度方向形成的涂膜的宽度方向的端部的精度。涂膜端部的精度的测定步骤包括以下步骤:在基材2上获得涂膜3的电子图像。从电子图像中提取包括涂膜端部31的评估区域4的图像;通过分析装置6获得涂膜3的光学轮廓和基材2的暴露表面的光学轮廓;在评价区域4内,将基准直线设定为与涂膜端部32大致平行,并根据该基准直线与该宽度方向的距离,由分析单元6求出凹凸尺寸的指标。涂膜端32;并根据涂膜端部32的整个延伸度获得细微不平整度的光滑度指数。

著录项

  • 公开/公告号JP6770691B2

    专利类型

  • 公开/公告日2020-10-21

    原文格式PDF

  • 申请/专利权人 株式会社豊田中央研究所;

    申请/专利号JP20170232638

  • 发明设计人 松永 拓郎;草野 巧巳;

    申请日2017-12-04

  • 分类号G01B11/30;G01B11/24;G01N21/88;

  • 国家 JP

  • 入库时间 2022-08-21 11:34:58

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