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QUANTIFICATION METHOD OF ACCURACY OF COATING FILM END PART, AND QUANTIFICATION DEVICE THEREOF

机译:涂膜端部精度的量化方法及其量化装置

摘要

PROBLEM TO BE SOLVED: To provide a quantification method of accuracy of a coating film end part that makes it possible to multilaterally and objectively evaluate accuracy of an end part in a width direction of a coating film formed in a longitudinal direction on a base material.;SOLUTION: A quantification method of accuracy of a coating film end part includes the steps of: obtaining an electronic image of a coating film 3 on a base material 2; extracting an image of an evaluation area 4 including a coating film end part 31 from the electronic image; obtaining an optical profile of a coating film 3, and an optical profile of an exposed surface of the base material 2 by analysis means 6; setting a reference straight line in almost parallel with a coating film end 32 inside the evaluation area 4, and obtaining an index of a size of unevenness by the analysis means 6 on the basis of a distance in the width direction between the reference straight line and the coating film end 32; and obtaining an index of smoothness of fine unevenness on the basis of an entire extention of the coating film end 32.;SELECTED DRAWING: Figure 1;COPYRIGHT: (C)2019,JPO&INPIT
机译:解决的问题:提供一种涂膜端部的精度的定量方法,该方法使得可以在基材上沿纵向形成的涂膜的宽度方向上多边和客观地评估端部的精度。解决方案:涂膜端部精度的定量方法包括以下步骤:获得基材2上涂膜3的电子图像;以及从电子图像中提取包括涂膜端部31的评估区域4的图像;通过分析装置6获得涂膜3的光学轮廓和基材2的暴露表面的光学轮廓;在评价区域4内,将基准直线设定为与涂膜端部32大致平行,并根据该基准直线与该宽度方向的距离,由分析单元6求出凹凸尺寸的指标。涂膜端32; ;并根据涂膜端部32的整个延伸度获得细小不平整度的光滑度指数。;选图:图1;版权:(C)2019,JPO&INPIT

著录项

  • 公开/公告号JP2019100879A

    专利类型

  • 公开/公告日2019-06-24

    原文格式PDF

  • 申请/专利权人 TOYOTA CENTRAL R&D LABS INC;

    申请/专利号JP20170232638

  • 发明设计人 MATSUNAGA TAKURO;KUSANO YOSHIMI;

    申请日2017-12-04

  • 分类号G01B11/30;G01B11/24;G01N21/88;

  • 国家 JP

  • 入库时间 2022-08-21 12:24:35

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