Device, method, and sample holder for testing photonic integrated circuits and photonic integrated circuits

摘要

Devices, methods, and sample holders for testing photonic integrated circuits and photonic integrated circuits. A method and apparatus for testing a photonic integrated circuit, and a corresponding sample holder and photonic integrated circuit are provided. Here, the location for the illumination light beam (15) can be selected via the scanning device (11), so that targeted coupling of the illumination light into the photonic integrated circuit (12) is possible. It is said. [Selection diagram] Fig. 1