首页>
外国专利>
Devices, methods and sample holders for testing photonic integrated circuits and photonic integrated circuits
Devices, methods and sample holders for testing photonic integrated circuits and photonic integrated circuits
展开▼
机译:用于测试光子集成电路和光子集成电路的装置,方法和样品架
展开▼
页面导航
摘要
著录项
相似文献
摘要
Methods and apparatus for testing a photonic integrated circuit (12) and a corresponding sample holder and a photonic integrated circuit are provided. By means of a scanning device (11), a location for an illumination light beam (15) can be selected so that a targeted coupling of the illumination light into the photonic integrated circuit (12) is made possible.
展开▼