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Method for manufacturing ultraviolet photodetector based on Ga2O3 material

机译:基于ga2o3材料的紫外光电探测器的制造方法

摘要

A method for manufacturing an ultraviolet photodetector based on Ga2O3 material are provided. The method includes: selecting a substrate; forming a Ga2O3 layer on an upper surface of the substrate; forming a top electrode on the Ga2O3 layer; and forming a bottom electrode on a lower surface of the substrate. Ga2O3 material is adopted, with a light transmittance in the solar blind area can reach 80% or even 90%. The Ga2O3 material is suitable for application to a light absorbing layer, and its transparent conductive electrical properties are also beneficial to improve the light absorption capacity of the light absorbing layer, thereby greatly improving the device performance of the photodetector diode.
机译:提供了一种基于Ga 2 O 3 材料的紫外光电探测器的制造方法。该方法包括:选择基板;在基板的上表面上形成Ga 2 O 3 层;在Ga 2 O 3 层上形成顶电极;在基板的下表面上形成底部电极。采用Ga 2 O 3 材料,在太阳盲区的透光率可以达到80%甚至90%。 Ga 2 O 3 材料适用于光吸收层,其透明导电性能也有利于提高光吸收层的光吸收能力。 ,从而大大提高了光电检测二极管的器件性能。

著录项

  • 公开/公告号US10629766B2

    专利类型

  • 公开/公告日2020-04-21

    原文格式PDF

  • 申请/专利权人 XIDIAN UNIVERSITY;

    申请/专利号US201816119067

  • 申请日2018-08-31

  • 分类号H01L31/107;H01L31/0224;H01L31/0304;H01L31/0312;H01L31/0336;H01L31/18;H01L31/032;H01L31/11;H01L21/02;C23C16/40;C23C14/08;C23C14/35;

  • 国家 US

  • 入库时间 2022-08-21 11:29:31

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