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Memory system having combined high density, low bandwidth and low density, high bandwidth memories

机译:具有组合的高密度,低带宽和低密度,高带宽存储器的存储系统

摘要

In an embodiment, a memory system may include at least two types of DRAM, which differ in at least one characteristic. For example, one DRAM type may be a high density DRAM, while another DRAM type may have lower density but may also have lower latency and higher bandwidth than the first DRAM type. DRAM of the first type may be on one or more first integrated circuits and DRAM of the second type may be on one or more second integrated circuits. In an embodiment, the first and second integrated circuits may be coupled together in a stack. The second integrated circuit may include a physical layer circuit to couple to other circuitry (e.g. an integrated circuit having a memory controller, such as a system on a chip (SOC)), and the physical layer circuit may be shared by the DRAM in the first integrated circuits.
机译:在一个实施例中,一种存储系统可以包括至少两种类型的DRAM,它们在至少一个特性上不同。例如,一种DRAM类型可以是高密度DRAM,而另一种DRAM类型可以具有比第一DRAM类型更低的密度,但是也可以具有更低的等待时间和更高的带宽。第一类型的DRAM可以在一个或多个第一集成电路上,并且第二类型的DRAM可以在一个或多个第二集成电路上。在一个实施例中,第一集成电路和第二集成电路可以堆叠在一起。第二集成电路可以包括耦合到其他电路的物理层电路(例如,具有存储器控制器的集成电路,例如片上系统(SOC)),并且物理层电路可以由DRAM中的DRAM共享。第一集成电路。

著录项

  • 公开/公告号US10573368B2

    专利类型

  • 公开/公告日2020-02-25

    原文格式PDF

  • 申请/专利权人 SUKALPA BISWAS;FARID NEMATI;

    申请/专利号US201716098916

  • 发明设计人 SUKALPA BISWAS;FARID NEMATI;

    申请日2017-03-06

  • 分类号G11C11/402;G11C5/06;G11C5/02;G11C7/02;G11C11/406;H01L25/065;H01L27/02;

  • 国家 US

  • 入库时间 2022-08-21 11:28:18

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