首页> 外国专利> Semiconductor device with multi-layered source/drain regions having different dopant concentrations and manufacturing method thereof

Semiconductor device with multi-layered source/drain regions having different dopant concentrations and manufacturing method thereof

机译:具有掺杂剂浓度不同的多层源极/漏极区的半导体器件及其制造方法

摘要

A method includes providing a substrate having a gate structure over a first side of the substrate, forming a recess adjacent to the gate structure, and forming in the recess a first semiconductor layer having a dopant, the first semiconductor layer being non-conformal, the first semiconductor layer lining the recess and extending from a bottom of the recess to a top of the recess. The method further includes forming a second semiconductor layer having the dopant in the recess and over the first semiconductor layer, a second concentration of the dopant in the second semiconductor layer being higher than a first concentration of the dopant in the first semiconductor layer.
机译:一种方法,包括:在衬底的第一面上提供具有栅极结构的衬底;形成与栅极结构相邻的凹口;以及在凹口中形成具有掺杂剂的第一半导体层,该第一半导体层是非保形的,第一半导体层衬在凹槽内,并从凹槽的底部延伸到凹槽的顶部。该方法还包括形成第二半导体层,该第二半导体层在凹部中并且在第一半导体层上方具有掺杂剂,第二半导体层中的掺杂剂的第二浓度高于第一半导体层中的掺杂剂的第一浓度。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号