2πN ]]> ;phase-shifting interval (where,; <math overflow="scroll"><mrow><mrow><mi>N</mi><mo>=</mo><mrow><mn>2</mn><mo></mo><mrow><mo>(</mo><mrow><mrow><mi>fix</mi><mo></mo><mrow><mo>(</mo><mfrac><mrow><mi>ceil</mi><mo></mo><mrow><mo>(</mo><mrow><mn>1</mn><mo>/</mo><mi>s</mi></mrow><mo>)</mo></mrow></mrow><mn>2</mn></mfrac><mo>)</mo></mrow></mrow><mo>+</mo><mn>1</mn></mrow><mo>)</mo></mrow></mrow></mrow><mo>,</mo></mrow></math> ;s is the shear ratio of the grating shearing interferometer), combined with a certain phase retrieval algorithm, the influence of all high-order diffraction beams on the phase retrieval accuracy is eliminated, and finally the wavefront measurement accuracy for the optical imaging system is improved."/> METHOD FOR WAVEFRONT MEASUREMENT OF OPTICAL IMAGING SYSTEM BASED ON GRATING SHEARING INTERFEROMETRY
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METHOD FOR WAVEFRONT MEASUREMENT OF OPTICAL IMAGING SYSTEM BASED ON GRATING SHEARING INTERFEROMETRY

机译:基于光栅剪切干涉法的光学成像系统波前测量方法

摘要

A method for wavefront measurement of optical imaging system based on grating shearing interferometry, the grating shearing interferometer comprising: a light source and illumination system, an optical imaging system to be tested, a one-dimensional diffraction grating plate, a two-dimensional diffraction grating plate, a two-dimensional photoelectric sensor and a computing unit. The one-dimensional diffraction grating plate and the two-dimensional diffraction grating plate are respectively placed on the object side and the image side of the optical imaging system to be tested. By collecting N sets of interferograms with a; <math overflow="scroll"><mfrac><mrow><mn>2</mn><mo></mo><mi>π</mi></mrow><mi>N</mi></mfrac></math> ;phase-shifting interval (where,; <math overflow="scroll"><mrow><mrow><mi>N</mi><mo>=</mo><mrow><mn>2</mn><mo></mo><mrow><mo>(</mo><mrow><mrow><mi>fix</mi><mo></mo><mrow><mo>(</mo><mfrac><mrow><mi>ceil</mi><mo></mo><mrow><mo>(</mo><mrow><mn>1</mn><mo>/</mo><mi>s</mi></mrow><mo>)</mo></mrow></mrow><mn>2</mn></mfrac><mo>)</mo></mrow></mrow><mo>+</mo><mn>1</mn></mrow><mo>)</mo></mrow></mrow></mrow><mo>,</mo></mrow></math> ;s is the shear ratio of the grating shearing interferometer), combined with a certain phase retrieval algorithm, the influence of all high-order diffraction beams on the phase retrieval accuracy is eliminated, and finally the wavefront measurement accuracy for the optical imaging system is improved.
机译:一种基于光栅剪切干涉法的光学成像系统波前测量方法,该光栅剪切干涉仪包括:光源和照明系统,待测光学成像系统,一维衍射光栅板,二维衍射光栅板,二维光电传感器和计算单元。一维衍射光栅板和二维衍射光栅板分别放置在要测试的光学成像系统的物体侧和像侧。通过收集N组干涉图,用a表示; <![CDATA [<数学溢出=“ scroll”> 2 π N ]]> ;相移间隔(where ,; <![CDATA [<数学溢出=“ scroll”> N = 2 < mo> fix ceil 1 / < / mo> s 2 + 1 < mo>, ]]> s是光栅剪切干涉仪的剪切比),结合一定的相位检索算法,消除了所有高阶衍射光束对相位检索精度的影响,最终光学成像系统的波前测量精度为改善。

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