首页> 外国专利> Die Stack Assembly Using An Edge Separation Structure For Connectivity Through A Die Of The Stack

Die Stack Assembly Using An Edge Separation Structure For Connectivity Through A Die Of The Stack

机译:使用边缘分离结构的裸片堆叠组件,用于通过堆叠的裸片进行连接

摘要

A die stack assembly includes first and second power semiconductor device dice. The first die has a P type peripheral edge separation structure that extends from the top planar semiconductor surface of the first die all the way to the bottom planar semiconductor surface of the die, and that is doped at least in part with aluminum. The backside of the first die is mounted to the backside of the second die. A metal feature that is not covered with passivation, and that can serve as a bonding pad, is disposed on part of the peripheral edge separation structure. A metal member (for example, a bond wire or metal clip) contacts the metal feature such that an electrical connection is established from the metal member, through the metal feature, through the peripheral edge separation structure of the first die, and to an electrode of the second die.
机译:管芯堆叠组件包括第一和第二功率半导体器件管芯。第一管芯具有P型外围边缘分离结构,该结构从第一管芯的顶部平面半导体表面一直延伸到管芯的底部平面半导体表面,并且至少部分地掺杂有铝。第一模具的背面被安装到第二模具的背面。未覆盖有钝化层并且可以用作焊盘的金属部件被布置在外围边缘分离结构的一部分上。金属构件(例如,接合线或金属夹)接触金属特征,从而从金属构件,通过金属特征,通过第一管芯的外围边缘分离结构并与电极建立电连接。第二个死亡。

著录项

  • 公开/公告号US2020266174A1

    专利类型

  • 公开/公告日2020-08-20

    原文格式PDF

  • 申请/专利权人 LITTELFUSE INC.;

    申请/专利号US202016869907

  • 发明设计人 ELMAR WISOTZKI;FRANK ETTINGSHAUSEN;

    申请日2020-05-08

  • 分类号H01L25/07;H01L29/167;H01L23;H01L23/498;H01L23/58;H01L23/31;H01L21/78;H01L25;H01L29/06;H01L29/08;H01L29/74;H01L29/417;

  • 国家 US

  • 入库时间 2022-08-21 11:24:29

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