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EQUIPMENT ANALYSIS SUPPORT APPARATUS, EQUIPMENT ANALYSIS SUPPORT METHOD, AND EQUIPMENT ANALYSIS SYSTEM

机译:设备分析支持装置,设备分析支持方法和设备分析系统

摘要

An equipment analysis support apparatus includes an equipment constraint information storage unit that stores equipment constraint information which is a correspondence relationship between each process constituting work performed using a plurality of pieces of equipment and a constraint to be imposed on the equipment in each process; a work process information acquisition unit that acquires work process information which is information on a process of the work currently in progress; a configuration information generation unit that, when it is determined that a current work state is changed, specifies a constraint to be imposed on the equipment in the changed work state and generates a configuration of analysis processing of the equipment satisfying the specified constraint based on the acquired work process information and the equipment constraint information; and a processing execution unit that performs processing necessary for analysis of the equipment based on the generated configuration.
机译:设备分析支持装置包括:设备限制信息存储单元,其存储设备限制信息,该设备限制信息是使用多个设备执行的构成工作的每个过程与要施加在每个过程中的设备之间的约束之间的对应关系;以及工作过程信息获取单元获取工作过程信息,该工作过程信息是关于当前正在进行的工作的过程的信息;配置信息生成单元,其在确定当前工作状态改变时,指定要施加于改变后的工作状态的设备上的约束,并基于该信息生成满足指定约束的设备的分析处理的配置获取工作流程信息和设备约束信息;处理执行单元基于所生成的配置来执行设备分析所需的处理。

著录项

  • 公开/公告号US2020068019A1

    专利类型

  • 公开/公告日2020-02-27

    原文格式PDF

  • 申请/专利权人 HITACHI LTD.;

    申请/专利号US201916299827

  • 发明设计人 SHIN TEZUKA;TOMOYA OOTA;YUJI KAKUTANI;

    申请日2019-03-12

  • 分类号H04L29/08;G08B21/18;H04L12/24;

  • 国家 US

  • 入库时间 2022-08-21 11:20:17

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