首页> 外国专利> Equipment analysis support apparatus, equipment analysis support method, and equipment analysis system

Equipment analysis support apparatus, equipment analysis support method, and equipment analysis system

机译:设备分析支持设备,设备分析支持方法和设备分析系统

摘要

An equipment analysis support apparatus includes an equipment constraint information storage unit that stores equipment constraint information which is a correspondence relationship between each process constituting work performed using a plurality of pieces of equipment and a constraint to be imposed on the equipment in each process; a work process information acquisition unit that acquires work process information which is information on a process of the work currently in progress; a configuration information generation unit that, when it is determined that a current work state is changed, specifies a constraint to be imposed on the equipment in the changed work state and generates a configuration of analysis processing of the equipment satisfying the specified constraint based on the acquired work process information and the equipment constraint information; and a processing execution unit that performs processing necessary for analysis of the equipment based on the generated configuration.
机译:设备分析支持设备包括一种设备约束信息存储单元,其存储设备约束信息,该信息是构成使用多个设备的构成工作的每个过程之间的对应关系,以及在每个过程中的设备上施加约束;工作过程信息获取单元,获取工作流程信息,这是关于目前正在进行的工作过程的信息;一种配置信息生成单元,当确定当前工作状态改变时,指定要在改变的工作状态中施加的约束,并生成满足指定约束的设备的分析处理的配置获得的工作流程信息和设备约束信息;和处理执行单元,用于基于生成的配置对设备进行分析所需的处理。

著录项

  • 公开/公告号US11044319B2

    专利类型

  • 公开/公告日2021-06-22

    原文格式PDF

  • 申请/专利权人 HITACHI LTD.;

    申请/专利号US201916299827

  • 发明设计人 SHIN TEZUKA;TOMOYA OOTA;YUJI KAKUTANI;

    申请日2019-03-12

  • 分类号G06F17;H04L29/08;H04L12/24;G08B21/18;H04N19/96;H04N19/176;H04N19/157;G01M99;

  • 国家 US

  • 入库时间 2022-08-24 19:28:15

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号