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Systems and methods for placement of singulated semiconductor devices for multi-site testing
Systems and methods for placement of singulated semiconductor devices for multi-site testing
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机译:用于放置单个半导体器件以进行多站点测试的系统和方法
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摘要
Systems and methods for multi-site placement of singulated semiconductor devices are presented. The systems and methods for multi-site placement may facilitate multi-site testing of the singulated semiconductor devices. A method may include determining a quantity of singulated semiconductor devices to be arranged in a test configuration. The method may also include determining, using a data processing device, a test configuration in response to the quantity. In further embodiments, the method may include placing the singulated semiconductor devices in a test frame according to the test configuration.
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