首页> 外国专利> ALIGNMENT METHOD FOR A BEAM-DIRECTING UNIT OF AN INTERFEROMETRIC MEASURING DEVICE, AND MEASURING DEVICE FOR CARRYING OUT AN INTERFEROMETRIC MEASUREMENT BY MEANS OF LASER RADIATION

ALIGNMENT METHOD FOR A BEAM-DIRECTING UNIT OF AN INTERFEROMETRIC MEASURING DEVICE, AND MEASURING DEVICE FOR CARRYING OUT AN INTERFEROMETRIC MEASUREMENT BY MEANS OF LASER RADIATION

机译:干涉测量设备的光束定向单元的对准方法,以及利用激光辐射方式进行干涉测量的测量设备

摘要

The invention relates to an alignment method for a beam-directing unit of an interferometric measuring device for directing a laser beam of a laser beam source towards a plurality of measurement points of a object under measurement, wherein a three-dimensional model of a measurement surface of an object under measurement is created by means of a plurality of spatially resolved images. The invention also relates to a measuring device for carrying out an interferometric measurement by means of laser radiation, having a control unit which is designed to align a beam-directing unit of the measurement device.
机译:干涉测量设备的光束定向单元的对准方法技术领域本发明涉及一种干涉测量设备的光束定向单元的对准方法,用于将激光束源的激光束引导至被测量物体的多个测量点,其中,测量表面的三维模型借助于多个空间分辨图像来创建被测对象的图像。本发明还涉及一种用于借助于激光辐射进行干涉测量的测量设备,其具有控制单元,该控制单元被设计为对准测量设备的光束引导单元。

著录项

  • 公开/公告号WO2019238508A1

    专利类型

  • 公开/公告日2019-12-19

    原文格式PDF

  • 申请/专利权人 POLYTEC GMBH;

    申请/专利号WO2019EP64712

  • 申请日2019-06-05

  • 分类号G01B11/25;G01B11/16;

  • 国家 WO

  • 入库时间 2022-08-21 11:14:14

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