首页> 外国专利> Alignment method for beam orientation unit of interferometric device and measuring apparatus for performing interferometry using laser irradiation

Alignment method for beam orientation unit of interferometric device and measuring apparatus for performing interferometry using laser irradiation

机译:用于干涉式装置的光束方向单元的对准方法和用于使用激光照射进行干涉测量的测量装置

摘要

The present invention relates to an alignment method for a beam alignment unit of an interferometric measuring apparatus for directing a laser beam of a laser light source to a plurality of measurement points of a measurement object; In the alignment method, a three-dimensional model of the measuring surface of the object to be measured is produced by a plurality of spatially resolved images.Further, the present invention relates to a measuring apparatus for performing an interferometric measurement by laser irradiation, and the measuring apparatus has a control unit formed to perform alignment of a beam orientation unit of the measuring apparatus.
机译:本发明涉及用于干涉测量装置的光束对准单元的对准方法,用于将激光光源的激光束引导到测量物体的多个测量点; 在对准方法中,通过多个空间分辨的图像产生待测量物体的测量表面的三维模型。较f,本发明涉及一种用于通过激光照射进行干涉测量的测量装置,并且 测量装置具有用于执行测量装置的光束方向单元的对准的控制单元。

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