NON-DESTRUCTIVE INSPECTION DEVICE, NON-DESTRUCTIVE INSPECTION SYSTEM, AND NON-DESTRUCTIVE INSPECTION METHOD

摘要

A non-destructive inspection device (1) having a structure whereby: a magnetic field application unit 3 and a magnetic sensor 21 are arranged in a first direction X; a first polarity magnetic field having N or S polarity is applied from the magnetic field application unit to a measurement target 8 that is adjacent to the array in a second direction Z and extends in the first direction; and the magnetic sensor detects a magnetic field from the measurement target in a state in which a magnetic field distribution is formed whereby the magnetic field attenuates over a first polarity range as the magnetic field moves further away from the magnetic field application unit along the first direction. The non-destructive inspection device is configured such that: the magnetic field can be measured by the magnetic sensor at a plurality of positions having different distances from the magnetic field application unit along the first direction; and the magnetic field distribution along the first direction corresponding to the distance from the magnetic field application unit can be obtained. Errors in the measurement target can be determined on the basis of the magnetic field distribution.