首页> 外国专利> METHOD OF GROWING SEMI-INSULATING SILICON CARBIDE SINGLE CRYSTAL INGOT AND APPARATUS FOR GROWING SILICON CARBIDE SINGLE CRYSTAL INGOT

METHOD OF GROWING SEMI-INSULATING SILICON CARBIDE SINGLE CRYSTAL INGOT AND APPARATUS FOR GROWING SILICON CARBIDE SINGLE CRYSTAL INGOT

机译:生长半绝缘碳化硅单晶锭的方法和用于生长碳化硅单晶锭的装置

摘要

One embodiment relates to a method of growing a semi-insulating SiC single crystal ingot, the method comprising the steps of: (1) placing a dopant coated with silicon carbide (SiC) and a carbon-based material into a reaction vessel containing a seed crystal fixed thereto; and (2) growing a SiC single crystal on the seed crystal, thereby yielding a high-quality semi-insulating SiC single crystal ingot with a uniform thickness-based doping concentration. In addition, another embodiment relates to a method of growing a semi-insulating silicon carbide single crystal ingot, the method comprising the steps of: (a) placing in a reaction vessel, a composition comprising a carbon-containing polymer resin, a solvent, a dopant, and silicon carbide (SiC); (b) solidifying the composition; and (c) growing a SiC single crystal ingot on a seed crystal fixed to the reaction vessel, thereby yielding a high-quality semi-insulating SiC single crystal ingot with a uniform thickness-based doping concentration. In addition, another embodiment relates to an apparatus for growing a SiC single crystal ingot, wherein the apparatus is capable of producing a high-quality SiC single crystal ingot that comprises porous bodies produced via carbonization or graphitization of a SiC composition, and thus has a uniform thickness-based doping concentration even when the diameter of the SiC single crystal ingot is large.
机译:一个实施方案涉及一种生长半绝缘的SiC单晶锭的方法,该方法包括以下步骤:(1)将涂覆有碳化硅(SiC)和碳基材料的掺杂剂放入包含种子的反应容器中水晶固定(2)在籽晶上生长SiC单晶,从而得到具有均匀的基于厚度的掺杂浓度的高质量半绝缘的SiC单晶锭。另外,另一实施方式涉及一种生长半绝缘碳化硅单晶锭的方法,该方法包括以下步骤:(a)将包含含碳聚合物树脂,溶剂的组合物置于反应容器中,掺杂剂和碳化硅(SiC); (b)固化组合物; (c)在固定在反应容器上的籽晶上生长SiC单晶锭,从而得到具有均匀的基于厚度的掺杂浓度的高质量的半绝缘SiC单晶锭。另外,另一实施方式涉及一种用于生长SiC单晶锭的设备,其中该设备能够生产高质量的SiC单晶锭,其包括通过SiC组合物的碳化或石墨化而产生的多孔体,因此具有即使当SiC单晶锭的直径较大时,均匀的基于厚度的掺杂浓度。

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