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CHIP ABNORMALITY DETECTION CIRCUIT AND CHIP ABNORMALITY DETECTION DEVICE

机译:芯片异常检测电路及芯片异常检测装置

摘要

A chip abnormality detection circuit and a chip abnormality detection device; the circuit comprises an abnormal signal detection circuit (40), which is configured to detect the reverse cut-off properties of an electrostatic protection diode (D2) of a chip to be detected and to output a corresponding detection signal.
机译:芯片异常检测电路和芯片异常检测装置;该电路包括异常信号检测电路(40),该异常信号检测电路被配置为检测待检测芯片的静电保护二极管(D2)的反向截止特性并输出相应的检测信号。

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