A PREFERRED SYSTEM FOR MEASURING JUNCTION TEMPERATURE OF PHOTONICS DEVICES

摘要

A system for measuring the junction temperature of a photonics device comprising a) a test chamber (1), wherein a photonics device to be tested is placed inside, b) at least one heater (2), c) at least one temperature sensor (3), d) a source-meter (5) configured to apply a driving current to the photonics device in order to read the corresponding forward voltage value at that temperature, e) a power supply (4), f) a control system (6) and g) a software (7) configured to start and control the measurements with either predefined default settings or the settings entered by the user.