首页> 外国专利> LOW CAPACITANCE AND HIGH-HOLDING-VOLTAGE TRANSIENT-VOLTAGE-SUPPRESSOR (TVS) DEVICE FOR ELECTRO-STATIC-DISCHARGE (ESD) PROTECTION

LOW CAPACITANCE AND HIGH-HOLDING-VOLTAGE TRANSIENT-VOLTAGE-SUPPRESSOR (TVS) DEVICE FOR ELECTRO-STATIC-DISCHARGE (ESD) PROTECTION

机译:用于静电放电(ESD)保护的低电容和高保持电压的瞬态电压抑制器(TVS)装置

摘要

A well-less Transient Voltage Suppressor (TVS) Silicon-Controlled Rectifier (SCR) has a P+ anode region (20) that is not in an N-well (62). The P+ anode region (20) is surrounded by N+ isolation regions (22, 24) near the surface, and a deep N+ region (30) underneath that is formed in a p-substrate (64). An N+ cathode region (40) is formed in the p-substrate (64). The deep N+ region (30) has a doping of 5 x 10 18 to 5 x 10 19/cm 3, compared to a doping of 1 x 10 16/cm 3 for a typical N-well (62), or a doping of 1 x 10 13 to 1 x 10 15/cm 3 for the p-substrate (64). The high doping in the deep N+ region (30) causes a recombination current that can shunt half of the anode current (IA). Since the deep N+ region (30) is much shallower than an N-well (62), the sidewall capacitance is greatly reduced, allowing for higher speed applications.
机译:无阱瞬态电压抑制器(TVS)硅控整流器(SCR)具有不在N阱(62)中的P +阳极区域(20)。 P +阳极区域(20)被表面附近的N +隔离区域(22、24)以及在p衬底(64)中形成的下方的深N +区域(30)围绕。在p衬底(64)中形成N +阴极区(40)。深N +区(30)的掺杂量为5 x 10 18 至5 x 10 19 / cm 3 对于典型的N型阱(62)为1 x 10 16 / cm 3 ,或者将1 x 10 13 掺杂到1 x 10 p基板的 15 / cm 3 (64)。在深N +区域(30)中的高掺杂会导致复合电流,该复合电流可以分流阳极电流(IA)的一半。由于深N +区域(30)比N阱(62)浅得多,因此大大减小了侧壁电容,从而允许进行更高速度的应用。

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