MATERIAL HIGH-TEMPERATURE DIELECTRIC PERFORMANCE TEST SYSTEM

摘要

Provided is a material high-temperature dielectric performance test system, comprising: a vector network analyzer (1), an electronic computer (2), a heating furnace (3), a wave guide tube (4), a test chamber (5), a sample rod (6), a vacuum pump (7), and an inflation apparatus (8); the waveguide tube (4) is fixed on the heating furnace (3) by means of a positioning flange (41), one end being connected to the vector network analyzer (1) and the other end being connected to the test chamber (5); a sample to be tested (10) is placed in the test chamber (5); the test chamber (5) and the sample to be tested (10) are placed in an effective hot zone of the heating furnace (3); the means of heating of the heating furnace (3) is microwave heating; the heating furnace chamber (31) is a closed space; the heating chamber (31) uses an air environment, or, in combination with the vacuum pump (7), achieves a vacuum environment in the furnace, or, in combination with the inflatable apparatus (8), achieves an inert atmosphere environment; a microwave signal is introduced by means of the waveguide tube (4), passes through the sample to be tested (10), then is then drawn out by means of the waveguide tube (4), and then enters the vector network analyzer (1), the analysis data of the vector network analyzer (1) being finally transmitted to the electronic computer (2). The present system achieves more efficient, fast, and energy-saving high-temperature dielectric performance testing.