首页> 外国专利> POWDER RATIO MEASUREMENT DEVICE, POWDER RATIO MEASUREMENT SYSTEM, POWDER RATIO MEASUREMENT METHOD, COMPUTER PROGRAM, BLAST FURNACE AND BLAST FURNACE OPERATION METHOD

POWDER RATIO MEASUREMENT DEVICE, POWDER RATIO MEASUREMENT SYSTEM, POWDER RATIO MEASUREMENT METHOD, COMPUTER PROGRAM, BLAST FURNACE AND BLAST FURNACE OPERATION METHOD

机译:粉末比测量装置,粉末比测量系统,粉末比测量方法,计算机程序,高炉和高炉操作方法

摘要

A powder ratio measurement device is provided, which, in operation processes of a blast furnace, etc., can measure in real time with high accuracy the powder ratio of powder adhered to the surface of the material used as a raw material. This powder ratio measurement device 12, which measures the powder ratio of a powder adhered to the surface of a substance 26, is provided with a lighting device 18 which illuminates the substance 26, a spectroscopic device 16 which splits the light reflected from the substance 26 and measures the spectral reflectance thereof, and a calculation device 22 which, of the spectral reflectance at each position on the surface of the substance measured by the spectroscopic device 16, uses at least the spectral reflectance of the region where the powder is adhered, calculates a value corresponding to the surface area of the region to which the powder is adhered, and calculates the powder ratio on the basis of said calculated value.
机译:本发明提供一种粉体比测定装置,该粉体比测定装置在高炉等的运转工序中,能够高精度地实时地测定附着在作为原料的材料的表面上的粉体的粉体比。在该粉末比率测定装置12中,对附着在物质26的表面上的粉末的粉末比率进行测定,并具备照明该物质26的照明装置18,和将从该物质26反射的光分离的分光装置16。并测量其光谱反射率,并且计算装置22计算在由光谱装置16测量的物质的表面上的每个位置处的光谱反射率中至少使用粘附有粉末的区域的光谱反射率。对应于粉末粘附区域的表面积的值,并基于所述计算值计算粉末比率。

著录项

  • 公开/公告号WO2020196487A1

    专利类型

  • 公开/公告日2020-10-01

    原文格式PDF

  • 申请/专利权人 JFE STEEL CORPORATION;

    申请/专利号WO2020JP12925

  • 发明设计人 YAMAHIRA NAOSHI;

    申请日2020-03-24

  • 分类号C21B7/24;F27D21;G01N15;G01N21/27;

  • 国家 WO

  • 入库时间 2022-08-21 11:09:16

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