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Board holding method, board holding device, processing method and processing apparatus

机译:基板保持方法,基板保持装置,处理方法及处理装置

摘要

The suction surface 7a of the stage 7 is provided with the fine suction groove 7b for attracting the wafer W. As shown in FIG. The suction groove 7b is divided into nine suction regions 61A to 61I, for example. The suction region 61I sucks the central portion of the circular wafer W. As shown in FIG. Suction regions 61A, 61B, 61C, 61D, 61E, 61F, 61G, 61H adsorb the peripheral portion of the circular wafer W. As shown in FIG. With respect to the wafer W held by the stage 7, gas is injected separately at nine positions corresponding to the suction areas 61A to 61I.
机译:在台7的吸引面7a上设有用于吸引晶片W的微小吸引槽7b。吸引槽7b例如被划分为9个吸引区域61A〜61I。吸附区域61I吸附圆形晶片W的中央部分。抽吸区域61A,61B,61C,61D,61E,61F,61G,61H吸附圆形晶片W的外围部分。对于载物台7所保持的晶片W,在与吸引区域61A〜61I对应的9个位置分别注入气体。

著录项

  • 公开/公告号KR102044085B1

    专利类型

  • 公开/公告日2019-11-12

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20177031887

  • 申请日2016-02-10

  • 分类号H01L21/683;H01L21/67;

  • 国家 KR

  • 入库时间 2022-08-21 11:08:33

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