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Manufacturing method of MEMS probe tip by ultra high frequency laser and MEMS probe tip designed by same method

机译:利用超高频激光制造MEMS探针的方法及采用该方法设计的MEMS探针

摘要

The present disclosure relates to a manufacturing method of a probe which can process a shape of a probe tip of a fine size in three dimensions, can process a plurality of probe tips at the same time, and can perform reprocess even when a probe tip is worn. More specifically, provided is the manufacturing method of a MEMS probe tip using an ultrahigh frequency laser, which comprises: a first step of measuring coordinates of probe pins on an upper surface of a probe head where a plurality of probe pins are placed through a guide hole; a second step of measuring the height of the probe pins; and a third step of processing a shape of a probe tip positioned on one side portion of the probe pin by a laser.
机译:本发明涉及一种探针的制造方法,该探针的制造方法可以在三个维度上加工精细尺寸的探针头的形状,可以同时加工多个探针头,并且即使在探针头处于磨损状态时也可以进行再加工。破旧。更具体地,提供了一种使用超高频激光的MEMS探针头的制造方法,该方法包括:测量探针头的上表面上的探针的坐标的第一步,通过引导件放置多个探针。孔;第二步,测量探针的高度;第三步骤是通过激光加工位于探针的一侧部分上的探针头的形状。

著录项

  • 公开/公告号KR20200023150A

    专利类型

  • 公开/公告日2020-03-04

    原文格式PDF

  • 申请/专利权人 SDA CO. LTD.;

    申请/专利号KR20180135389

  • 发明设计人 KANG SHIN KYO;IM CHANG MIN;SIM SANG BUM;

    申请日2018-11-06

  • 分类号G01R1/067;B23K26/21;B23K26/60;G01R1/073;G01R3;

  • 国家 KR

  • 入库时间 2022-08-21 11:07:47

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